Theindustrial computed tomography (CT)It is a key tool for non-destructive analysis of complex components. Within the framework of a scientific study recently published in theIEEE Aerospace and Electronic Systems Magazine,AMS – Advanced Machine Systemsparticipated by contributing its technological capacity incomputed tomography metrology, applied to the analysis of an electronic system intended for space applications.
The study: qualification of an On-Board Computer for CubeSats
The work, titled“Qualification of a COTS based CubeSat OBC Through Proton Irradiation with a Die-Level Dose Estimation”, was carried out by a research team fromUNSAM–CONICET and CNEA, and aimed to evaluate theresilience against ionizing radiationof theOn-Board Computer LabOSat-02, designed for nanosatellites operating inlow earth orbit (LEO).
As part of the qualification process, the system was subjected to14 MeV proton irradiation, remaining fully operational during the test, while memory errors, electrical consumption, temperature and interface operation were monitored.
AMS's role in the study
AMS was responsible for performing the computed tomography (CT) of the LabOSat-02 module, a key step within the work methodology.
The authors expressly thank AMS for this contribution, indicating that the computed tomography allowed us to performmore precise theoretical calculations, fundamental for the analysis of the behavior of the system under radiation.
The tomography was performed using aZEISS METROTOM 800 equipment, reference technology inhigh precision industrial computed tomography.
METROTOM CT Scan: Critical Information for Scientific Analysis
The study used CT scan results to:
- Determine theactual dimensions of the die (silicon chip)of the microcontroller
- Accurately measure theencapsulation thicknessestop and bottom
- Get anon-destructive internal representationof the electronic component
These geometric data, obtained by CT, were used asinput parametersin physical simulations (TRIM), which made it possible to calculate how much energy the protons deposit within the silicon and, consequently, estimate thechip-level absorbed dose (die-level dose estimation).
The report highlights that this approach improves precision compared to estimates based solely on generic or datasheet values.
Industrial computed tomography applied to highly demanding sectors
AMS's participation in this study demonstrates howMETROTOM industrial computed tomographyIt is a strategic tool not only for quality control and dimensional metrology, but also foradvanced scientific research, including aerospace and high reliability electronics applications.
The capacity ofvisualize, measure and analyze complex internal structures without destroying the componentIt is decisive in environments where the precision of geometric data directly impacts physical models and engineering decisions.
